PA
For high density mounting boards etc
SERIES
Special Feature
With a simple lift-and-drop operation that takes only a few seconds, very stable probing to the measurement target is possible.
The included loupe always magnifies the area around the probe tip, enabling probing of the smallest measurement target.
Signals are captured via a specially designed fine-axis (Φ0.6) hard gold-plated probe. Since the probe has a thinner shaft (Φ0.6) than oscilloscope and tester probes, probing of minute components is possible.
※Probes with needle tips can be changed to commercially available tester probes, semiconductor probes, etc. upon request. Please contact us for details.
By adjusting the focus of the attached loupe to the needle tip, more precise work is possible.
It also allows signals to be taken out from consecutive pins of a sandwich pitch IC, which is nearly impossible with lead soldering or IC clips.
Specifications and Models
| Type | L(mm)※ | H(mm) | Arm configuration |
|---|---|---|---|
|
PA-400
|
400 | 175 |
Wide range
|
|
PA-320
|
320 | 158 |
Medium
|
|
PA-270
|
270 | 145 |
Small
|
|
PA-320W
|
320(270) | 158 |
2 arms※2
|
|
PA-400W
|
400(320) | 175 |
2 arms※2
|
※The arm length (L) is the length from the center of the base when the arm is fully extended. In the case of PA-400, the measurable range is within an approximate radius of 400 meters.
※The 2-arm type comes with two arms.Two arms are set with two arms of different lengths for ease of operation.For example, PA-400W has two arms with L=400 and L=320.This allows each arm to be operated independently without interference.
PA-270
PA-400W
Pricing and Delivery
Delivery time for all PA series models is usually one week.