メインビジュアル

PRODUCTS

This is an operation scene of 2D type probe positioner “PF-320W”.
Please take a look at the excellent operability and high stability.

Micogic's Probe Positioner

The unique structure of the product provides excellent operability
​​​​​​​and is favored by many professionals.

Micogic's probe positioners are divided into two types, 2D type and 3D type, depending on the structure to suit the application.
The 2D type is suitable for measurement targets such as boards laid flat on a desk, and is mainly used for measurement in a horizontal plane.
The 3D type is designed to accommodate not only flat PCBs, but also vertically oriented PCBs that are incorporated into equipment.
Furthermore, each type is available in several series according to the specifications of the tip and arm configuration.
Within each series, several models are available according to the number and length of arms.

(Reference) What is a probe positioner?

2D Type Probe Positioner

image

The unique structure of Micogic's probing tool makes it easy and stable to measure PCBs on a desk top.
It can be operated with one hand in just a few seconds, just like “placing a needle on a record disc".
The 2D type of Micogic is a reliable measurement tool that meets a wide range of needs.


Features.
Easy lift-and-drop operation enables extremely stable probing in just a few seconds.
By setting the attached loupe, the area near the tip of the probe is always magnified, enabling accurate probing of minute measurement targets.
Gravity is used to generate probing pressure for stable contact.
Three series of 2D-type probe positioners are available with different tips.

● PF Series
Designed to contact oscilloscope probes directly to the board. Particularly suitable for applications such as high-frequency measurements using FET probes.

● PA Series
Designed to capture signals via a hard gold-plated probe with a thin tip. Greatly improves workability when probing high-density mounting boards.

● PL Series
​​​​​​​Same structure as the PA series, but lighter contact load makes it ideal for probing thin films and fine parts.It is best suited for probing thin films and fine components.​​​​​​​

2D Type Probe Positioner
​​​​​​​Series List

イメージ
イメージ

PF Series

Contacts FET probes or passive probes directly to the substrate.

イメージ
イメージ

PA Series

Signals are captured through a hard gold plated probe (Φ0.6).
Suitable for probing high-density mounting boards, etc.

イメージ
イメージ

PL Series

Same structure as the PA series, but with less needle tip load, making it suitable for measurements on thin films and microelectronic components.

3D Type Probe Positioner

image

It can be used for both horizontal and vertical substrates.
The stroke shaft, a unique structure, enables fine position adjustment, and the probing pressure using a spring mechanism provides stable probing in all directions.


  1. ・The probe can probe not only flat substrates, but also vertically standing substrates such as those built into equipment.
  2. ・The attached loupe enables the probe tip to be magnified at any time, making it possible to probe even the smallest of objects.
  3. ・The probe is designed to use gravity or spring pressure to generate probing pressure.

●PV Series
​​​​​​​Quickly explore large areas and fine-tune

●PS Series
​​​​​​​Although the measurement range is limited to some extent, fine adjustments can be made in the same way as with the PV series.

イメージ

PV series 2-arm type PV-220W

イメージ

PS-200 mounted on a desk with clamp (optional)

3D Type Probe Positioner
​​​​​​​Series List

イメージ
イメージ

PV Series

  • ・Wide range adjustment arm and fine adjustment mechanism enable wide range probing and fine adjustment.
  • ・Stroked shaft mechanism for high workability and stable probing
イメージ
イメージ

PS Series

  • ・Equipped with fine adjustment mechanism
  • ・Stroked shaft mechanism for high workability and stable probing

Option

Optional parts are available to further enhance the performance and operability of the probe positioner.
Select the option that best suits your application and environment.

Probe Positioner Model List

表

Option List

表